Journals
Books
Articles by keyword microcircuit
System-in-Package: Mounting Bare Chips as a Method for Increasing the Integration Level of Multifunctional Modules
Т. S. Dyachenko
Definition of optimum structure of tests of plates and microcircuits on presence of defects
V.K. Doroshevich, P.V. Doroshevich
The order of carrying out of physicotechnical examination at an estimation of quality of microcircuits
V.K. Doroshevich
Research of influence of technological operations on quality of microcircuits
V.K. Doroshevich, K.K. Doroshevich
Research of influence of quality of materials on quality of microcircuits
V.K. Doroshevich
Definition of an opportunity of reduction of plans of the control over functionally difficult microcircuits
V.K. Doroshevich, P.V. Doroshevich
Accelerated Simulation of Thermal and Mechanical Reliability of Electronic Devices and Circuits. Example of an integrated circuit simulation in ASONIKA-M-3D
A. Shalumov - General Director of «Scientific research institute» ASONIKA» (Russia), Dr. Sc. (Eng.), Professor, the academician of the International academy of information, the winner of the award of the Government of the Russian Federation in the field of a science and the technics, managing chair of information technology of Vladimir branch RANHiGS (Russia). E-mail: ALS140965@mail.ru
E. Pershin - Ph. D., Research Assistant of «Scientific research institute» ASONIKA» (Russia)
Аnatoly Korkin - Professor-researcher, Arizona State University, Tempe, AZ (USA)
Valeriy Khaldarov - Mechanical and Aerospace Engineering, Arizona State University, Tempe, AZ (USA)
Modernization of auxiliary workshops and its role in increasing the efficiency of integrated circuits
A.V. Chelenko - Post-graduate Student, Kaluga branch of the Bauman MSTU E-mail: apererva@yandex.ru
Hybrid integrated circuit design for particular application

Y.A. Divakova

 RTU MIREA (Moscow, Russia)

Methodical and algorithmic tools of computer-aided probabilistic analysis of microwave microcircuits parameters

S.A. Meshkov – Ph.D. (Eng.), Associate Professor, Bauman Moscow State Technical University E-mail: sb67241@mail.ru

Neural network methods for integral structure non-destructive testing

A. Yu. Viryasova – Master, Bauman Moscow State Technical University

E-mail: virnastya@yandex.ru

A. I. Vlasov – Ph.D. (Eng.), Associate Professor, Department of Design and Production Technology of Electronics, Bauman Moscow State Technical University

E-mail: vlasovai@bmstu.ru

A. A. Gladkikh – Ph.D. (Eng.), Associate Professor, Department of Design and Production Technology of Electronics, Bauman Moscow State Technical University

E-mail: a.gladkikh@inforion.ru