V.K. Doroshevich, K.K. Doroshevich

By manufacture of microcircuits probably occurrence of various kinds of refusals. Incomplete removal of an oxidizer from a surface of a crystal during manufacturing microcircuits can lead to breaks of metallized distributing at hit of a moisture inside of the case of the ready circuit. Negligence at резке and ломке plates on crystals can cause occurrence of short circuits of gold conductors on initial silicon at edge of a crystal. Refusals of film resistors in the majority are defined by technological defects: mechanical damages of a resistive layer and pollution of resistive layers. Poor-quality connections are one of the basic kinds of refusals microcircuits. Hit of a moisture inside of the case before hermetic sealing the device or at insufficient tightness of the case while in service leads to refusals microcircuits in connection with that chemical reaction proceeding at it leads to formation Al2O3. On the basis of the data of interrelation of kinds and the reasons of refusals with technological operations, parameters of elements of the case and a crystal it is possible to estimate methods of physicotechnical examination quality ready microcircuits.