Journals
Books
Articles by keyword surface roughness
The optimization of the mechanical surface processing technology of SiC wafers
V. V. Popov - Ph.D. (Eng.), General Director, JSC «Svetlana», St.-Peterburg
V. N. Vyuginov - Ph.D. (Eng.), Director, CJSC «Svetlana-Semiconductors», St.-Peterburg. E-mail: mail@svetlana-ep.ru
N. K. Travin - Leading Engineer, CJSC «Svetlana-Semiconductors», St.-Peterburg. E-mail: travin@svetlana-ep.ru
The production development of finish surface processing technology of SiC epi-ready wafers
V. V. Popov - Ph.D. (Eng.), General Director, JSC «Svetlana», St.-Peterburg
The optimization of the mechanical surface processing technology of SiC wafers
V. V. Popov - Ph.D. (Eng.), General Director, JSC «Svetlana», St.-Peterburg V. N. Vyuginov - Ph.D. (Phys.-Math.), Director, CJSC «Svetlana-Semiconductors», St.-Peterburg. E-mail: mail@svetlana-ep.ru N. K. Travin - Leading Engineer, CJSC «Svetlana-Semiconductors», St.-Peterburg. E-mail: travin@svetlana-ep.ru
The production development of finish surface processing technology of SiC epi-ready wafers
V. V. Popov - Ph.D. (Eng.), General Director, JSC «Svetlana», St.-Peterburg
Influence of process conditions of magnetron sputtering on the mechanical stresses and surface roughness of molybdenum films
V.N. Zima - Ph.D. (Eng.), Leading Research Scientist, PJSC «ONIIP». E-mail: info@oniip.ru
T.N. Tanskaya - Junior Research Scientist, PJSC «ONIIP». E-mail: info@oniip.ru
Nanostructuring of polymers surfaces with the use of ion-plasma technologies for improvement of their antibacterial properties
V.M. Elinson - Dr. Sc. (Eng.), Professor, Russian State Technological University by K.E. Tsiolkovsky «MATI», Moscow A.N. Lyamin - Ph. D. (Eng.), Associate Professor, Russian State Technological University by K.E. Tsiolkovsky «MATI», Moscow P.A. Schur- Research Scientist, Russian State Technological University by K.E.Tsiolkovsky "MATI", Moscow B.S. Khaziev - Research Scientist, Russian State Technological University by K.E. Tsiolkovsky «MATI», Moscow
Calculation of losses in a rectangular waveguide with rough shielding surfaces
V.V. Biryukov - Ph. D. (Eng.), Associate Professor, Nizhny Novgorod State Technical University n.a. R.E. Alekseev. E-mail: birukovvv@mail.ru
Effect of imperfection (roughness) of the waveguide walls surface on its characteristics

V. V. Biryukov – Dr.Sc. (Eng.), Professor, Department of Physics and Technology of Optical Communication, Nizhny Novgorod State Technical University n.a. R.E. Alekseev

E-mail: birukovvv@mail.ru

V. A. Grachev – Ph.D. (Eng.), Associate Professor, Department of Physics and Technology of Optical Communication, Nizhny Novgorod State Technical University n.a. R.E. Alekseev

Numerical techniques of the estimation the amount of waveguides surface roughness for the THz regime

N.V. Fedorkova, A.A. Sultanshin

Bauman Moscow State Technical University(Moscow, Russia)

Circular shielded waveguide with rough inner surface

V. V. Biryukov – Dr.Sc. (Eng.), Professor, Department of Physics and Technology of Optical Communication, Nizhny Novgorod State Technical University n.a. R.E. Alekseev

E-mail: birukovvv@mail.ru

V. A. Grachev – Ph.D. (Eng.), Associate Professor, Department of Physics and Technology of Optical Communication,

Nizhny Novgorod State Technical University n.a. R.E. Alekseev

S. G. Lobin – Post-graduate Student, Department of Physics and Technology of Optical Communication, Nizhny Novgorod State Technical University n.a. R.E. Alekseev