V.V. Biryukov - Ph. D. (Eng.), Associate Professor, Nizhny Novgorod State Technical University n.a. R.E. Alekseev. E-mail: birukovvv@mail.ru

The intensive development of the various branches of modern technology extremely high frequency (EHF) ranges places high demands on guiding electrodynamic structures. Small transverse dimensions of the waveguides EHF lead to serious technological problems in their manufacture. This is because at high frequencies determine the slip factor influencing the characteristics of the waveguide, is the quality of the shielding surfaces processing. The paper proposes an approach based on the concept of Brillouin partial waves and allowing consider random surface roughness of arbitrary shape. In a waveguide with rough walls at the reflection of the partial wave phase relations among the secondary waves, forming a reflected wave, are broken. This reduces a resulted reflectance and own propagating waves become decreasing even in case of perfectly conducting shielding surfaces. Thus, the attenuation of waves, caused by the roughness on the surface, can be found by correction of the conductivity of the screen material. The frequency dependent losses of a rectangular waveguide of standard cross section of 1.6/0.8 mm for the case of smooth copper walls and surface roughness of 1, 5 and 10 µm, respectively are presented. The results of the study allow define the quality requirements of processing internal surfaces of the waveguides, which is particularly important in MMW and terahertz ranges. As example, the dependence on the frequency of the amount of allowable surface roughness, in which the loss is not increasing by more than 10%, is presented.

 

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