Journals
Books
Articles by keyword resistivity
Resistivity measuring methods of the semi-insulating SiC wafers
V. V. Popov - Ph.D. (Eng.), General Director, JSC «Svetlana», St.-Peterburg
The temperature effect on resistivity of SiC wafers
V. V. Popov - Ph.D. (Eng.), General Director, JSC «Svetlana», St.-Peterburg
Resistivity measuring methods of the semi-insulating SiC wafers
V. V. Popov - Ph.D. (Eng.), General Director, JSC «Svetlana», St.-Peterburg
Measurement of resistivity by four-sonde method and electrical resistance by four-pin device

A.Yu. Kozhevnikov – Senior Research Scientist, Dukhov Research Institute of Automatics is the Leading  Enterprise of the State Atomic Energy Corporation ROSATOM

Е-mail: com andre980@list.ru

E.V. Egorova – Ph.D. (Eng.), Associate Professor, Department of Telecommunication Systems, Russian Technological University MIREA

Е-mail: calipso575@gmail.com

Technological aspects of the manufacture of MMIC

А.G. Gudkov1, V.N. Vyuginov2, V.V. Popov3, Yu.V. Solov’ev4, N.К. Travin5, S.V. Chizhikov6,
R.V. Agandeev7, V.D. Sсhashurin8

1,6–8 Bauman Moscow State Technical University (Moscow, Russia)

2 Electronic Instrumentation at V.I. Ulyanov (Lenin) SPbGETU «LETI» (St. Petersburg, Russia)

3 PJSC «Svetlana» (St. Petersburg, Russia)

4,5 JSC «Svetlana-Electronpribor» (St. Petersburg, Russia)