Journals
Books
Articles by keyword x-ray spectroscopy
Failure analysis of electronic components аnd integrated circuits
V.A. Smetannikow
Electronic structure of ion-modified materials. Part 2: X-ray-emission spectroscopy
D. А. ZATSEPIN, A. S. SIGOV, E. Z. KURMAEV
Electronic structure of ion-Modified materials. Part 2: X-Ray-Emission Spectroscopy
D.А. Zatsepin, A.S. Sigov, E.Z. Kurmaev
Electronic structure of ion-modified materials. Part 2: X-ray-emission spectroscopy
D.А. Zatsepin, A.S. Sigov, E.Z. Kurmaev
On the possibility of indirect measurement of the thin carbon films Thickness using energy-dispersive analysis

I.A. Sorokin1, D.V. Kolodko2

1,2 Fryazino branch of Kotelnikov IRE of RAS (Fryazino, Russia)

1,2 National Research Nuclear University Moscow Engineering Physics Institute (Moscow, Russia)