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Articles by keyword инжекция
Injection methods of testing gate dielectric MOS IC
V.V. Andreev, А.А. Stolyarov, V.G. Dmitriev, A.V. Romanov
A new method of gate dielectric degradation analysis in nigh-speed field-effect transistor
V.E. Drach - Ph. D. (Eng.), Associate Professor, EIU1-KF, Kaluga branch of the Bauman MSTU. E-mail: drach@kaluga.org
A.V. Rodionov - Ph. D. (Eng.), Associate Professor, EIU2-KF, Kaluga branch of the Bauman MSTU. E-mail: andviro@gmail.com
Simulated physical studies of emitting nanostructures for laser technology
D.K. Nikiforov - Ph. D. (Phys.-Math.), Associate Professor, Financial University - Kaluga Branch, Kaluga branch of the Bauman MSTU. E-mail: DKNikiforov@fa.ru
Monitoring of radiation influences by using of sensors based on mis structures
V.V. Andreev - Dr. Sc. (Eng.), Professor, Kaluga branch of the Bauman MSTU E-mail: vladimir_andreev@bmstu.ru A.V. Romanov - Post-graduate Student, Kaluga branch of the Bauman MSTU E-mail: romanov@okbmel.ru A.A. Stolyarov - Dr. Sc. (Eng.), Professor, Head of Department «Design and manufacturing of electronic equipment», Kaluga branch of the Bauman MSTU E-mail: a.a.stolyarov@bmstu.ru D.M. Akhmelkin - Post-graduate Student, Kaluga branch of the Bauman MSTU E-mail: dmitriy.akhmelkin@gmail.com
Oscillations of photocurrent in the structure of a space-time electro-optical modulator in the presence of monopolar injection from illuminated contact

Yu.I. Kuzmin1

1 Ioffe Physical Technical Institute of Russian Academy of Sciences (Saint Petersburg, Russia)

1 iourk@yandex.ru