Journals
Books
Articles by keyword МОП-транзистор
Problems of Scaling of CMOS VLSI Characteristics
N.V. Masalsky
Analysis of metal-oxide semiconductor field-effect transistors parameters by low temperature
A. M. Pilipenko, V. N. Biryukov
The integrated voltage reference with a double stabilization and technology dispersion compensation
R.R. Fakhrutdinov - Design Engineer, Omsk State Technical University. E-mail: nopr_11@mail.ru K.V. Murasov - Ph.D. (Eng.), Junior Research Scientist, Omsk State Technical University. E-mail: murasov_k@yahoo.com R.A. Wolf - Junior Research Scientist, Omsk State Technical University. E-mail: 1986wolf@gmail.com S.A. Zavyalov - Ph.D. (Eng.), Associate Professor, Omsk State Technical University. E-mail: zavyalov62@mail.ru A.N. Lepetaev - Ph.D. (Eng.), Associate Professor, Omsk State Technical University. E-mail: lan@inbox.ru
Analysis of processes in radiation-sensitive MOSFETS and structures during irradiation and post-radiation annealing

V.P. Zhalnin1, G.A. Moskvin2, A.E. Lisitsa3, D.I. Ermakov4

1–4 Bauman Moscow State Technical University (Moscow, Russia)
1zhalnin@mail.ru, 2georgmos140170@gmail.com, 3lisitsabmstu@gmail.com, 4ermakovdi822@gmail.com