Journals
Books
Articles by keyword МДП-структура
The quality test of dielectric layers of integrated circuits and products of microsystem engineering
V.V. Andreev, А.А. Stolyarov, D.S. Vasjutin, A.M. Mikhal'kov
The Quality Test of Dielectric Layers of Integrated Circuits and Products of Microsystem Engineering
V.V. Andreev, А.А. Stolyarov, D.S. Vasjutin, A.M. Mikhal'kov
Injection methods of testing gate dielectric MOS IC
V.V. Andreev, А.А. Stolyarov, V.G. Dmitriev, A.V. Romanov
Monitoring of radiation influences by using of sensors based on mis structures
V.V. Andreev - Dr. Sc. (Eng.), Professor, Kaluga branch of the Bauman MSTU E-mail: vladimir_andreev@bmstu.ru A.V. Romanov - Post-graduate Student, Kaluga branch of the Bauman MSTU E-mail: romanov@okbmel.ru A.A. Stolyarov - Dr. Sc. (Eng.), Professor, Head of Department «Design and manufacturing of electronic equipment», Kaluga branch of the Bauman MSTU E-mail: a.a.stolyarov@bmstu.ru D.M. Akhmelkin - Post-graduate Student, Kaluga branch of the Bauman MSTU E-mail: dmitriy.akhmelkin@gmail.com