Journals
Books
Articles by keyword electrical resistivity
Resistivity measuring methods of the semi-insulating SiC wafers
V. V. Popov - Ph.D. (Eng.), General Director, JSC «Svetlana», St.-Peterburg
The temperature effect on resistivity of SiC wafers
V. V. Popov - Ph.D. (Eng.), General Director, JSC «Svetlana», St.-Peterburg
Resistivity measuring methods of the semi-insulating SiC wafers
V. V. Popov - Ph.D. (Eng.), General Director, JSC «Svetlana», St.-Peterburg
Technological aspects of the manufacture of MMIC

А.G. Gudkov1, V.N. Vyuginov2, V.V. Popov3, Yu.V. Solov’ev4, N.К. Travin5, S.V. Chizhikov6,
R.V. Agandeev7, V.D. Sсhashurin8

1,6–8 Bauman Moscow State Technical University (Moscow, Russia)

2 Electronic Instrumentation at V.I. Ulyanov (Lenin) SPbGETU «LETI» (St. Petersburg, Russia)

3 PJSC «Svetlana» (St. Petersburg, Russia)

4,5 JSC «Svetlana-Electronpribor» (St. Petersburg, Russia)