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Articles by keyword atomic-force microscopy
THE COMPARISON OF OPTICAL PROPERTIES AND SHAPES FOR SILVER AND IRON NANOSIZED PARTICLES OBTAINED BY CHEMICAL REDUCTION OF METAL IONS IN REVERSE MICELLES
A.A. Revina, S.V. Daineko, A.N. Bolshakova, N.A. Yashtulov, Z.M. Tomova, V.I. Zolotarevski
About the influence of stationary and electron beam heating on electrophysical characteristics nanoscaled sol-gel alumina films
E.V. Lugovoy, S.P. Avdeev, P.V. Serba, M.V. Rubashkina, V.V. Tkachuk
Study of the protein aggregates formation in the presence of potassium and europium ions by photon-correlation spectroscopy and atomic-force microscopy
T.N. Tikhonova - Post-graduate Student, Department of Molecular Physics, Faculty of Physics, M.V. Lomonosov Moscow State University; Junior Research Scientist, Establishment of the Russian Academy of Sciences the Institute of Microelectronics, Moscow. E-mail: t.n.tikhonova@yandex.ru
G.P. Petrova - Dr.Sc. (Phys.-Math.), Professor, Department of Molecular Physics, Faculty of Physics, M.V. Lomonosov Moscow State University. E-mail: petrova@phys.msu.ru
V.V. Kashin - Research Scientist, V.A. Kotel-nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Moscow. E-mail: vadim_kashin@mail.ru
S.V. Krupenin - Research Scientist, V.A. Kotel-nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Moscow. E-mail: krupenin@cplire.ru
E.M. Eganova - Junior Research Scientist, Establishment of the Russian Academy of Sciences the Institute of Microelectronics, Moscow. E-mail: eganovaem@mail.ru