Journals
Books
Articles by keyword MOS-structure
The quality test of dielectric layers of integrated circuits and products of microsystem engineering
V.V. Andreev, А.А. Stolyarov, D.S. Vasjutin, A.M. Mikhal'kov
The Quality Test of Dielectric Layers of Integrated Circuits and Products of Microsystem Engineering
V.V. Andreev, А.А. Stolyarov, D.S. Vasjutin, A.M. Mikhal'kov
Injection methods of testing gate dielectric MOS IC
V.V. Andreev, А.А. Stolyarov, V.G. Dmitriev, A.V. Romanov