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Books
Articles by keyword толщина
PLANAR NANO-STRUCTURES FORMATION FEATURES ON MOLECULAR-DOPED VANADYL PHTHALOCYANINE
E. S. LEONOV, P.А. LUTCHNIKOV, G.L. PAKHOMOV, V.V. ТRAVKIN
Effect of mollecular additives on interior stress decrease in nanostructured sol-gel PZT films
P.Р. Lavrov - Рost-graduate Student, Stagier-Researcher, MGTU MIREA. Е-mail: lavrov@mirea.ru
A.V. Kornyukhin - Рost-graduate Student, MGTU MIREA. Е-mail: lavrov@mirea.ru
Layer analysis of thickness of different neocortical areas in rats raised in complete darkness or under natural light

E.V. Loseva – Dr.Sc. (Biol.), Chief Research Scientist, Laboratory of Functional Neurocytology,  Institute of Higher Nervous Activity and Neurophysiology of RAS (Moscow)

E-mail: losvnd@mail.ru 

N.A. Loginova – Ph.D. (Biol.), Senior Research Scientist, Laboratory of Functional neurocytology, 

Institute of Higher Nervous Activity and Neurophysiology of RAS (Moscow)

E-mail: nadezhda.loginova1982@gmail.com

V.V. Gavrilov – Ph.D. (Psychol.), Senior Research Scientist, Laboratory of psychophysiology,  Institute of Psychology of RAS (Moscow); 

Senior Research Scientist, Institute of Experimental Psychology under Moscow State University  of Psychology and Education

E-mail: nvvgav@mail.ru

Sensitivity of the acoustic normal waves towards variations in elastic properties of thin crystalline plates

V.I. Anisimkin – Dr.Sc. (Phys.-Math), Principal Research Scientist, 

Kotel’nikov Institute of Radioengineering ang Electronics of RAS (Moscow) 

M.A. Zemlyanitsin – Leading Engineer, 

Kotel’nikov Institute of Radioengineering ang Electronics of RAS (Moscow) 

I.A. Nedospasov – Junior Research Scientist, 

Kotel’nikov Institute of Radioengineering ang Electronics of RAS (Moscow)

On the possibility of indirect measurement of the thin carbon films Thickness using energy-dispersive analysis

I.A. Sorokin1, D.V. Kolodko2

1,2 Fryazino branch of Kotelnikov IRE of RAS (Fryazino, Russia)

1,2 National Research Nuclear University Moscow Engineering Physics Institute (Moscow, Russia)

A method for measuring the thickness of dielectric coatings on a conductive base with usage of dielectric resonator

V.G. Anisimov – Senior Lecturer, 

Department «RadioEngineering», Ulyanovsk State Technical University

E-mail: kontrol@ulstu.ru

A.G. Tashlinskii – Dr.Sc.(Eng.), Professor, Head of Department «RadioEngineering»,  Ulyanovsk State Technical University

E-mail: tag@ulstu.ru