Journals
Books
Articles by keyword МДП-структура
The quality test of dielectric layers of integrated circuits and products of microsystem engineering
V.V. Andreev, А.А. Stolyarov, D.S. Vasjutin, A.M. Mikhal'kov
Modelling and Optimization MOS-Structures Analog IC
A.V. Turetsky
The Quality Test of Dielectric Layers of Integrated Circuits and Products of Microsystem Engineering
V.V. Andreev, А.А. Stolyarov, D.S. Vasjutin, A.M. Mikhal'kov
Injection methods of testing gate dielectric MOS IC
V.V. Andreev, А.А. Stolyarov, V.G. Dmitriev, A.V. Romanov
Monitoring of radiation influences by using of sensors based on mis structures
V.V. Andreev - Dr. Sc. (Eng.), Professor, Kaluga branch of the Bauman MSTU E-mail: vladimir_andreev@bmstu.ru A.V. Romanov - Post-graduate Student, Kaluga branch of the Bauman MSTU E-mail: romanov@okbmel.ru A.A. Stolyarov - Dr. Sc. (Eng.), Professor, Head of Department «Design and manufacturing of electronic equipment», Kaluga branch of the Bauman MSTU E-mail: a.a.stolyarov@bmstu.ru D.M. Akhmelkin - Post-graduate Student, Kaluga branch of the Bauman MSTU E-mail: dmitriy.akhmelkin@gmail.com
The properties of nanoscale transition layer on the insulator-semiconductor interface in the MIS structures based on MBE n(p)-Hg<sub>1-x</sub>Cd<sub>x</sub>Te (x = 0.21-0.23) with near-surface graded-gap layers and without such layers
A.V. Voitsekhovskii - Dr.Sc. (Phys.-Math.), Head of Department, National Research Tomsk State University E-mail: vav43@mail.tsu.ru N.A. Kulchitsky - Dr.Sc. (Eng.), Professor, Moscow Technological University (MIREA), Lomonosov Moscow State University E-mail: n.kulchitsky@gmail.com S.N. Nesmelov - Ph.D. (Phys.-Math.), Senior Research Scientist, National Research Tomsk State University E-mail: nesm69@mail.ru S.M. Dzyadukh - Ph.D. (Phys.-Math.), Research Scientist, National Research Tomsk State University E-mail: bonespirit@sibmail.com