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Articles by keyword mos transistors
Analysis of processes in radiation-sensitive MOSFETS and structures during irradiation and post-radiation annealing

V.P. Zhalnin1, G.A. Moskvin2, A.E. Lisitsa3, D.I. Ermakov4

1–4 Bauman Moscow State Technical University (Moscow, Russia)
1zhalnin@mail.ru, 2georgmos140170@gmail.com, 3lisitsabmstu@gmail.com, 4ermakovdi822@gmail.com