Y. DUSCH IEMN, UMR CNRS 8520, PRES Lille Nord de France, ECLille, 59651 Villeneuve d-Ascq, France. E-mail: yannick.dusch@centraliens-lille.org N. TIERCELIN V.A. Kotelnikov Institute of Radioengineering and Electronics, 125009 Moscow, Russia A. KLIMOV V.A. Kotelnikov Institute of Radioengineering and Electronics, 125009 Moscow, Russia V. RUDENKO IEMN, UMR CNRS 8520, PRES Lille Nord de France, ECLille, 59651 Villeneuve d-Ascq, France. E-mail: yannick.dusch@centraliens-lille.org Y. IGNATOV V.A. Kotelnikov Institute of Radioengineering and Electronics, 125009 Moscow, Russia S. HAGE-ALI IEMN, UMR CNRS 8520, PRES Lille Nord de France, ECLille, 59651 Villeneuve d-Ascq, France. E-mail: yannick.dusch@centraliens-lille.org P. PERNOD IEMN, UMR CNRS 8520, PRES Lille Nord de France, ECLille, 59651 Villeneuve d-Ascq, France. E-mail: yannick.dusch@centraliens-lille.org V. PREOBRAZHENSKY IEMN, UMR CNRS 8520, PRES Lille Nord de France, ECLille, 59651 Villeneuve d-Ascq, France. E-mail: yannick.dusch@centraliens-lille.org; Wave Research Center, GPI RAS, 38 Vavilov str., Moscow, 119991, Russia

Dusch Y., Tiercelin N., Klimov A., Rudenko V., Ignatov Y., Hage-Ali S., Pernod P., Preobrazhensky V.