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Articles by keyword capacitance-voltage characteristics
Thermostability MIS-capacitors based on SiO<sub>2</sub> and Si<sub>3</sub>N<sub>4</sub>
V.L. Oleynik - Junior Research Scientist, Tomsk State University V.V. Kopyev - Junior Research Scientist, Tomsk State University E-mail: dozorx777@gmail.com