Journals
Books
Articles by keyword x-ray reflectometry
Structure of SiC and C nano-sized films on Si substrates synthesised by magnetron and ion-beam target sputtering
I.K. Beysembetov, K.Kh. Nusupov, N.B. Beysenkhanov, S.K.Zharikov, B.K. Kenzhaliev, T.K. Akhmetov, R. Ivlev
Formation and structure of nanosized layer of silicon carbide on silicon by implantation of high doses of carbon ions
I.K. Beysembetov, K.Kh. Nusupov, N.B. Beysenkhanov, S.K.Zharikov, B.K. Kenzhaliev, T.K. Akhmetov