Journals
Books
Articles by keyword traps
The energy spectrum of electrons in the wide-gap one-dimensional structures with regular defects
A.O. Litinski, Nguyen Thi Sa
A new method of gate dielectric degradation analysis in nigh-speed field-effect transistor
V.E. Drach - Ph. D. (Eng.), Associate Professor, EIU1-KF, Kaluga branch of the Bauman MSTU. E-mail: drach@kaluga.org
A.V. Rodionov - Ph. D. (Eng.), Associate Professor, EIU2-KF, Kaluga branch of the Bauman MSTU. E-mail: andviro@gmail.com
Electrical fluctuations in semiconductors caused by traps

B.I. Yakubovich1

1Petersburg Nuclear Physics Institute named by B.P. Konstantinov (Leningradskaya oblast, Gatchina, Russia)