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Articles by keyword transfer characteristics
Simulation of nanoelectronic device structures based on 2D materials

I.I. Abramov1, N.V. Kalameitsava2, V.A. Labunov3, I.A. Romanova4, I.Yu. Shcherbakova5

1–5 Belarusian State University of Informatics and Radioelectronics (Minsk, Belarus)
 

Mathematical models of matrix photodetectors and TV cameras taking into account noise characteristics

I.A. Grechukhin1, I.I. Zubkov2, I.A. Kalinin3, A.M. Moiseev4, P.E. Novikov5

1-5 JSC “Precision Systems and Instruments” (Moscow, Russia)