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Articles by keyword static timing analysis
Methods for improving the reliability of combinational microelectronic curcuits based on multiinterval timing analysis
S.V. Gavrilov - Dr. Sc. (Eng.), Professor, Head of Department of Digital Circuit Design Automation, Institute for design problems in microelectronics RAS (Moscow). E-mail: sergey_g @ippm.ru G.A. Ivanova - Junior Research Scientist, Department of Digital Circuit Design Automation, Institute for design problems in microelectronics RAS (Moscow). E-mail: pirutina_g@ippm.ru D.I. Ryzhova - Junior Research Scientist, Department of Digital Circuit Design Automation, Institute for design problems in microelectronics RAS (Moscow). E-mail: ryzhova_d@ippm.ru A.L. Stempkovsky - Dr. Sc. (Eng.), Academic of RAS, Professor, Director of Institute for design problems in microelectronics RAS (Moscow). E-mail: stal09@ippm.ru