Stepan A. Lapshinov¹, Vadim A. Shakhnov², Anton V. Yudin³

1, 3 Technical Education Center, SBVEI “Vorobyovy Gory” (Moscow, Russia)

2, 3 Department IU4 of Designing and Technology of Electronic Equipment, Bauman Moscow State Technical University (Moscow, Russia)

I.V. Trundaev1

1 Financial University under the Government of the Russian Federation (Moscow, Russia)
1 ivan_t98@mail.ru

I.A. Ulchenko1, A.A. Nikolaev2, D.V. Khazheev3, N.A. Volkov4, M.S. Glushkov5, A.A. Belkanov6

1–6 Morinformsystema-Agat Concern (Moscow, Russia)
1ivan_ulchenko@mail.ru, 2A.A.Nikolaev@yandex.ru, 3Hazheev.D@yandex.ru, 4nvolkov32@yandex.ru, 5glushkov.maxim@gmail.com, 6workBelkanov@gmail.com

M.E. Botov1, I.V. Pakhomov2, I.V. Gurin3, N.S. Kucheryavykh4, E.O. Garanin5

1-5 Don State Technical University (Rostov-on-Don, Russia)

1 GurinIV86@yandex.ru; 2 kucheryavyh.n@gs.donstu.ru; 3 vbif.27@yandex.ru; 4 ipahomov@donstu.ru, 5 egaranin@donstu.ru