Journals
Books
Articles by keyword metrological accuracy.
O.V. Stukach – Dr.Sc.(Eng.), Associate Professor, Professor, ISHITR department,
National Research Tomsk Polytechnic University
E-mail: tomsk@ieee.org
I.V. Sychev – Director, LTD «KIPLAIN» (Novosibirsk)
E-mail: hr@kipline.ru