А.G. Gudkov1, S.G. Vesnin2, V.Yu. Leushin3, I.А. Sidorov4, V.G. Tikhomirov5, М.К. Sedankin6,
S.V. Chizhikov7, R.V. Agandeev8, V.D. Sсhashurin9

1–4,6–9 Bauman Moscow State Technical University (Moscow, Russia)

5 Electronic Instrumentation at V.I. Ulyanov (Lenin) SPbGETU «LETI» (St. Petersburg, Russia)

8 JSC «NPI FIRMA HYPERION» (Moscow, Russia)

А.G. Gudkov1, S.G. Vesnin2, V.Yu. Leushin3, I.А. Sidorov4, V.G. Tikhomirov5, М.К. Sedankin6,
S.V. Chizhikov7, R.V. Agandeev8, V.D. Sсhashurin9

1–4,6–9 Bauman Moscow State Technical University (Moscow, Russia)

5 Electronic Instrumentation at V.I. Ulyanov (Lenin) SPbGETU «LETI» (St. Petersburg, Russia)

8 JSC «NPI FIRMA HYPERION» (Moscow, Russia)