Journals
Books
Articles by keyword МОП-транзисторы
Problems of Scaling of CMOS VLSI Characteristics
N.V. Masalsky
Analysis of processes in radiation-sensitive MOSFETS and structures during irradiation and post-radiation annealing

V.P. Zhalnin1, G.A. Moskvin2, A.E. Lisitsa3, D.I. Ermakov4

1–4 Bauman Moscow State Technical University (Moscow, Russia)
1zhalnin@mail.ru, 2georgmos140170@gmail.com, 3lisitsabmstu@gmail.com, 4ermakovdi822@gmail.com