Journals
Books
Articles by keyword оценка соответствия
ANALYSIS OF TOLERANCE ADMISSION PROBLEM TO RADIOELECTRONIC EQUIPMENT PARAMETERS
E.P. Stroganova
CONFORMITY ESTIMATION OF RADIOELECTRONIC EQUIPMENT USING THE SPIKES THEORY
E.P. Stroganova
Current state of nanotechnology and methodological approach to characteristics appraisal of nanotechnochology products
S.A. Dubyanskiy - Expert, JSC «RUSNANO», Moscow. E-mail: sergey.dubyanskiy@rusnano.com
Current state of nanotechnology and methodological approach to characteristics appraisal of nanotechnochology products
S.A. Dubyanskiy - Expert, JSC «RUSNANO», Moscow. E-mail: sergey.dubyanskiy@rusnano.com