I.Yu. Bratukhin1, A.F. Kryachko2, G.M. Revunov3

1,2,3 Saint Petersburg State University of Aerospace Instrumentation (St. Petersburg, Russia)

1 JSC "Concern "Avtomatika" (St. Petersburg, Russia)

2 alex_k34.ru@mail.ru

The high efficiency of modern non-destructive testing and remote sensing tools is primarily achieved through the implementation of appropriate measurement data processing. When diagnosing inhomogeneous media, the scattering properties of elastic and electromagnetic waves are used, and the measured values of the scattered field strength are processed based on the solution of the corresponding inverse problem for the medium parameters. For flat layered media, a one-dimensional model is used to solve such problems. Solutions to problems of estimating the parameters of layered media are based on the fact that the initial data are complex-valued frequency dependences of the scattered field parameters. Measuring complex values of electromagnetic field parameters, and in particular the reflection coefficient, over a wide frequency range is a rather complex task. Measuring instruments use bridge and heterodyne circuits to compare the field strength at the measurement point with the field from a reference harmonic source. The measured complex value is determined from the phase and amplitude differences. For non-destructive testing devices, high-frequency broadband measurement techniques that do not require the determination of complex-valued parameters are most suitable. This requires the development of a new research direction aimed at solving the inverse problem with partially known initial data.

Bratukhin I.Yu., Kryachko A.F., Revunov G.M. Solving the inverse scattering problem for a layered dielectric based on the absolute value of measured parameters // Achievements of Modern Radioelectronics. 2026. V. 80. № 9. P. 114−121. DOI: https://doi.org/10.18127/j20700784-202609-12

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