No. 7, 2008
- Statistic Imitation Modeling Method Investigation of Random Antennas
- Some Peculiarities of the Law of Degradation of Energy
- Physical Characteristics SOI of Transistors for Nanoelectronics
- The Mechanisms, determining fluctuations of threshold voltages of short-channel CMOS transistors
- The Barrier Method for Constructing the Radio-Wave System of Short-Term Foreshock Acquisition
