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Articles by keyword Microwave measurements
Measuring the parameters of the «nanometer metal film - dielectric» structure using waveguide-dielectric resonance
D.A. Usanov - Dr. Sc. (Phys.-Math.), Professor, Head of Department of Solid State Physics, Saratov State University named after N.G. Chernyshevsky, Academic of RANS, Honored Scientist of RF. E-mail: UsanovDA@info.sgu.ru A.V. Skripal - Dr. Sc. (Phys.-Math.), Professor, Department of Solid State Physics, Saratov State University named after N.G. Chernyshevsky. E-mail: Skripala_v@info.sgu.ru D.V. Ponomarev - Ph. D. (Phys.-Math.), Associate Professor, Department of Solid State Physics, Saratov State University named after N.G. Chernyshevsky. E-mail: Ponomarev87@mail.ru E.V. Latysheva - Post-graduate Student, Department of Solid State Physics, Saratov State University named after N.G. Chernyshevsky. E-mail: Ekatushka@list.ru
Resonant properties of a multilayer strip-slot transition and its application for microwave measurements of dielectric properties of materials

D.G. Fomin, N.V. Dudarev, S.N. Darovskikh, D.S. Klygach, M.G. Vakhitov

South Ural State University (National Research University) (Chelyabinsk, Russia)