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Articles by keyword ggMOS
Analysis of the behavior of TCAD and SPICE diode models in ESD protection circuits

A.V. Tuchin1, N.R. Krasikov2, V.K. Lanovoy3, P.A. Kondratovich4, A.Yu. Tkachev5, G.I. Glushkov6

1, 2, 4 Voronezh State University (Voronezh, Russia)
1–6 JSC «ICC Milandr» (Zelenograd, Moscow Region, Russia)
1tuchin.av@milandr.ru, 2krasikov.n@milandr.ru, 3lanovoy.v@milandr.ru, 4kondratovich.p@milandr.ru, 5tkachev.a@milandr.ru, 6glushkov.gi@milandr.ru