Journals
Books
Articles by keyword спектральная плотность мощности.
Automated measuring system for investigating temperature dependence of low-frequency noise spectra in electronic elements and structures

A.V. Ermachikhin – Ph.D. (Phys.-Math.), Associate Professor of Department of Micro- and Nanoelectronics

V.G. Litvinov – Dr.Sc. (Phys.-Math.), Associate Professor, Leading Research Scientist,
Head of Department of Micro- and Nanoelectronics

E.P. Trusov – Post-graduate Student аспирант of Department of Micro- and Nanoelectronics

S.A. Kostryukov – Ph.D. (Phys.-Math.), Engineer of Department of Micro- and Nanoelectronics