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Articles by keyword приборы на квантоворазмерных эффектах
Improving the efficiency of the reliability model of nanoelectronic devices based on GaAs/AlxGa(1-x) As-heterostructures with the transverse current transport within their VAC modeling
V.D. Shashurin - Dr.Sc. (Eng.), Professor, Head of Department of Instrumentation Technology, Bauman Moscow State Technical University E-mail: schashurin@bmstu.ru N.A. Vetrova - Ph.D. (Eng.), Associate Professor, Bauman Moscow State Technical University E-mail: vetrova@bmstu.ru E.V. Kuimov - Student, Bauman Moscow State Technical University E-mail: ekjmo@mail.ru