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Articles by keyword приборно-технологическое моделирование
Analysis of the behavior of TCAD and SPICE diode models in ESD protection circuits

A.V. Tuchin1, N.R. Krasikov2, V.K. Lanovoy3, P.A. Kondratovich4, A.Yu. Tkachev5, G.I. Glushkov6

1, 2, 4 Voronezh State University (Voronezh, Russia)
1–6 JSC «ICC Milandr» (Zelenograd, Moscow Region, Russia)
1tuchin.av@milandr.ru, 2krasikov.n@milandr.ru, 3lanovoy.v@milandr.ru, 4kondratovich.p@milandr.ru, 5tkachev.a@milandr.ru, 6glushkov.gi@milandr.ru