Journals
Books
Articles by keyword подзатворный диэлектрик
A new method of gate dielectric degradation analysis in nigh-speed field-effect transistor
V.E. Drach - Ph. D. (Eng.), Associate Professor, EIU1-KF, Kaluga branch of the Bauman MSTU. E-mail: drach@kaluga.org
A.V. Rodionov - Ph. D. (Eng.), Associate Professor, EIU2-KF, Kaluga branch of the Bauman MSTU. E-mail: andviro@gmail.com
Hardware implementation of charge pumping technique
V.E. Drach - Ph. D. (Eng.), Associate Professor, Department «Design and manufacturing of electronic equipment», Kaluga branch of the Bauman MSTU. E-mail: drach@kaluga.org A.V. Rodionov - Ph. D. (Eng.), Associate Professor, Department «Computer systems and networks», Kaluga branch of the Bauman MSTU. E-mail: andviro@gmail.com I.V. Chukhraev - Ph. D. (Eng.), Associate Professor, Head of Department «Computer systems and networks», Kaluga branch of the Bauman MSTU. E-mail: igor.chukhraev@mail.ru