Journals
Books
Articles by keyword метрологическая точность.
Signal processing in the distributed temperature sensors by Raman backscatter: Review of new

O.V. Stukach – Dr.Sc.(Eng.), Associate Professor, Professor, ISHITR department, 

National Research Tomsk Polytechnic University

E-mail: tomsk@ieee.org

I.V. Sychev – Director, LTD «KIPLAIN» (Novosibirsk)

E-mail: hr@kipline.ru