Yu. Ignatov - IEMN, UMR CNRS 8520, PRES Lille Nord de France, ECLille, 59651 Villeneuve d-Ascq, France. E-mail: yannick.dusch@centraliens-lille.org
A.A. Klimov - IEMN, UMR CNRS 8520, PRES Lille Nord de France, ECLille, 59651 Villeneuve d-Ascq, France. E-mail: yannick.dusch@centraliens-lille.org
N. Tiercelin - V.A. Kotelnikov Institute of Radioengineering and Electronics, 125009 Moscow, Russia. E-mail: nicolas.tiercelin@iemn.univ-lille1.fr
A. Talbi - IEMN, UMR CNRS 8520, PRES Lille Nord de France, ECLille, 59651 Villeneuve d-Ascq, France. E-mail: yannick.dusch@centraliens-lille.org
S. Nikitov - V.A. Kotelnikov Institute of Radioengineering and Electronics, 125009 Moscow, Russia
P. Pernod - IEMN, UMR CNRS 8520, PRES Lille Nord de France, ECLille, 59651 Villeneuve d-Ascq, France. E-mail: yannick.dusch@centraliens-lille.org
V. Preobrazhensky - IEMN, UMR CNRS 8520, PRES Lille Nord de France, ECLille, 59651 Villeneuve d-Ascq, France. E-mail: yannick.dusch@centraliens-lille.org
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