2019
2018
- A mathematical model of the influence of varying zones on the carrier concentration profile of semiconductor structures pp. 87-92
- Modeling methods for the diagnostics of solid-state thermoelastic structures pp. 65-68
- Modeling grouping of the electron beam by using structures with variable dielectric constant pp. 91-94
- Images segmentation by the fuzzy clustering algorithm using texture-fractal features values estimates pp. 27-43