Journals
Books
Articles by keyword MOS device
Dynamic Power Optimization for VLSI and System-on-Chip
V.M. Dyakonov, A.V. Korshunov, A.V. Marinych
A new method of gate dielectric degradation analysis in nigh-speed field-effect transistor
V.E. Drach - Ph. D. (Eng.), Associate Professor, EIU1-KF, Kaluga branch of the Bauman MSTU. E-mail: drach@kaluga.org
A.V. Rodionov - Ph. D. (Eng.), Associate Professor, EIU2-KF, Kaluga branch of the Bauman MSTU. E-mail: andviro@gmail.com