Journals
Books
Articles by keyword погреш-ности изготовления
Research of the influence of manufacturing errors on the parameters of transistors for monolithic microwave integrated circuits and identification of key factors determining their stability as part of a miniature radiothermograph

V.G. Tikhomirov1, S.V. Chizhikov2

1 St. Petersburg State Electrotechnical University «LETI» (St. Petersburg, Russia)

2 Bauman Moscow State Technical University (Moscow, Russia)

2 LLC Scientific and Production Innovative Company “Hyperion” (Moscow, Russia)