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Articles by keyword наивный байесовский метод
Modern methods of computer vision and their practical application in the problem of defectoscopy of integrated circuits

A.Yu. Shafigullina1, D.I. Klimov2, T.T. Mamedov3, I.R. Gubaidullin4

1–4 Joint Stock Company "Russian Space Systems" (Moscow, Russia)

2 National Research University "Moscow Power Engineering Institute" (Moscow, Russia)

1 postgraduate contact@spacecorp.ru, 2 klimov.di@spacecorp.ru,
3 mamedov.tt@spacecorp.ru, 4 gubaidullin.ir@spacecorp.ru