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Articles by keyword дефекты микросхем
Neural network methods for integral structure non-destructive testing

A. Yu. Viryasova – Master, Bauman Moscow State Technical University

E-mail: virnastya@yandex.ru

A. I. Vlasov – Ph.D. (Eng.), Associate Professor, Department of Design and Production Technology of Electronics, Bauman Moscow State Technical University

E-mail: vlasovai@bmstu.ru

A. A. Gladkikh – Ph.D. (Eng.), Associate Professor, Department of Design and Production Technology of Electronics, Bauman Moscow State Technical University

E-mail: a.gladkikh@inforion.ru