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Journal Electromagnetic Waves and Electronic Systems №5 for 2017 г.
Article in number:
Influence of thin dielectric films quality on the integrated circuits reliability
Type of article: scientific article
UDC: 621.396
Keywords: integrated circuit transistor capacitor dynamic characteristics slew rate operational amplifier.
Authors:

O.N. Glotova – Process Engineer, JSC "VOSHOD"-KRLZ

E-mail: luckyfox13@mail.ru

S.A. Adarchin – Ph. D. (Eng.), Associate Professor, Kaluga branch of the Bauman MSTU E-mail: adarchin@rambler.ru

Abstract:

The main parameters of the bipolar n-p-n-transistor influencing the dynamic performance of the operational amplifiers. Defined impact analysis of parameters such as the depth of the base of the transistor, the magnitude of the thin-film capacitor, the value of the base resistor on DU intake currents, the slew rate the slew rate (response rate), and the settling time of the output voltage.

Pages: 40-46
References
  1. Gotra Z.Yu. Texnologiya mikroe'lektronny'x ustrojstv. Spravochnik. M.: Radio i svyaz'. 1991.
  2. Komarov F.F. Ionnaya i fotonnaya obrabotka materialov. Ucheb. posobie dlya studentov vuzov. Mn.: Belgosuniversitet. 1998.
  3. Maly'sheva I.A. Texnologiya proizvodstva integral'ny'x mikrosxem. M: Radio i svyaz'. 1991.
  4. Nikolaev I.M., Filinyuk N.A. Integral'ny'e mikrosxemy' i osnovy' ix proektirovaniya. M.: Radio i svyaz'. 1992.
  5. Ren'yan V.R. Texnologiya poluprovodnikovogo kremniya / Per. s angl. M.: Metallurgiya. 1999.
  6. Stepanenko I.P. Osnovy' mikroe'lektroniki. M.: Sov. radio. 1980.
Date of receipt: 13 июня 2017 г.