G.N. Zhizhin, A.P. Kiryanov, А.K. Nikitin, О.V. Khitrov

Foundations of the conducting surface infrared interferometry when the probing radiation being converted in surface plasmons (SPs) interacts with the sample are presented in the paper. Interferometric techniques enabling one to determine the SPs - complex refractive index at a definite frequency are described. A number of SPs - interferometers schemes are specified and their functioning is numerically tested. Static Fourier-spectroscopy potentialities in respect to a conducting surface guiding a broad spectrum of SPs excited by a laser radiation pulse are considered as well.