Article or book title, author's surname, DOI

Comparative assessment of circuit layout dimensions in heterogeneous integration and thin films technologies, analysis of active components nonlinearity

F.A. Baron1, S.Z. Galeev2, F.V. Zelenov3, A.B. Ivanov4, S.O. Konovalov5, А.N. Masyugin6, A.V. Strezh7

research article UDC 621.3.049.776.21 Pages: 136-140

  1. 1 Dr.Sc. (Eng.), Deputy Chief Technology Officer of Microelectronics Division, JSC «SPE «Radiosviaz» (Krasnoyarsk)
  2. 2 Deputy Manager of Microelectronics Production Line, JSC «SPE «Radiosviaz» (Krasnoyarsk)
  3. 3,4,5,6 Process Engineer, JSC «SPE «Radiosviaz» (Krasnoyarsk)
  4. 7 Chief Technologist, JSC «SPE «Radiosviaz» (Krasnoyarsk)

Abstract

We are trying to solve two problems by doing some rough estimates. First, we estimate the size reduction of RF transceiver module (RFTM) when transitioning from heterogeneous integration technology to monolithic integration on multilayer ceramic board (MCB). MCB uses thin film passive components and discrete foreign active elements integrated on single ceramic board. We compare heterogeneous integration technology versus MCB based on the net foot print area of RFTM components. At second, we compare nonlinearity of basic types of transistors: MOS, BJT, HEMT, MESFET, JFET. For that we expand their I-V curve formulae into Taylor series. Using the expansion series coefficients we calculate IIP3 for each transistor and compare them accordingly.

How to cite

Барон Ф.А., Галеев С.З., Зеленов Ф.В., Иванов А.Б., Коновалов С.О., Масюгин А.Н., Стреж А.В. Теоретический анализ массогабаритных характеристик и нелинейности при переходе от гибридных сборок к технологии монокристаллических плат // Успехи современной радиоэлектроники. 2017. № 12. С. 136–140.

References
  1. Yuan Taur, Tak H. Ning Modern VLSI Devices. Cambridge University Press. 2013.
  2. Sigfrid Yngvesson Microwave Semiconductor Devices / Springer Science & Business Media. 1991.
  3. Behzad Razavi RF Microelectronics. Prentice Hall PTR. 1998.