V.V. Zverintsev - Post-graduate Student, Reshetnev Siberian State Aerospace University (Krasnoyarsk). E-mail: hopmxod007@mail.ru L.V. Zverintseva - Ph. D. (Eng.), Associate Professor, Reshetnev Siberian State Aerospace University (Krasnoyarsk). E-mail: zverintsevalv@mail.ru G.V. Kochkina - Senior Lecturer, Reshetnev Siberian State Aerospace University (Krasnoyarsk). E-mail: kochkina@gmail.com

The enterprises of the aerospace and electronic engineering industries there is a problem obtaining the current-carrying surfaces of thin-walled curved waveguides and straight form. The presence of losses in the lines of the microwave energy transmission in the preparation of high and medium power leads to heating of the line, and in the preparation of very low self-noise power lines caused losses are commensurate with the desired signal. The required surface roughness of the inner waveguide at the microwave frequency power: Ra 0.40-0.20 microns at 3-10 GHz; Ra 0.100-0.025 microns is more than 10 GHz [1]. Providing roughness less inside the noncircular waveguide Ra 0,63 microns presently difficult. Proposed polishing sectional curved waveguides abrasive paste it along with roundtrip processed channel. A computer model of pressure, withstand the waveguide walls, and strength calculations. Experiments confirming the possibility of a new process to reduce the current-carrying surface roughness.

 

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