I.V. Chukhraev - Ph. D. (Eng.), Associate Professor, Kaluga branch of the Bauman MSTU. E-mail: igor.chukhraev@mail.ru V.E. Drach - Ph. D. (Eng.), Associate Professor, Kaluga branch of the Bauman MSTU. E-mail: drach@kaluga.org

Nowadays, the development of electronic equipment is characterized by ever-increasing demands on its quality, which, in turn, is determined not only by the quality of manufacturing processes, but also, vastly by electronic components, such as semiconductor devices. In its turn, the modern manufacture of semiconductor devices is characterized by continuous development of existing and development of new methods for quality control of the individual operations and the entire process as a whole. This is essential not only to detect, but also to prevent the manufacturing defects by statistical methods of quality management, based on a quantitative evaluation of different parameters of the product. The aspects of statistical quality control of the process of semiconductor multimode pulse injection lasers of LPI-101 model is described in this article. Analysis of the quality of the process was based on the pulse duration measurement of the laser radiation. To evaluate the stability and reproducibility of the process, the Shewhart control charts were used. It is shown, that the process of LPI 101 lasers at OJSC «Voskhod»-KRLZ is characterized by stability and reproducibility. In order to maintain the process at the required level, a constant monitoring of the changing distributions of process reproducibility is required. This will ensure the duly taking of preventive and corrective actions aimed at improving product quality and reducing the financial costs of rework.

 

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