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Journal Radioengineering №9 for 2018 г.
Article in number:
A mathematical model of the influence of varying zones on the carrier concentration profile of semiconductor structures
Type of article: scientific article
DOI: 10.18127/j00338486-201809-17
UDC: 621.315.592
Authors:

V.B. Baiburin – Honored Scientist of RF, Dr.Sc.(Phys.-Math.), Professor, Head of Department «Information security of automated systems», Yuri Gagarin State Technical University of Saratov

E-mail: baiburinvb@rambler.ru

V.A. Kuznetsov – Dr.Sc.(Phys.-Math.), Professor, Department «Information security of automated systems», Yuri

Gagarin State Technical University of Saratov

E-mail: kuznetsov.va1948@yandex.ru

S.L. Chernyshev – Dr.Sc.(Eng.), Professor, Department «Radio Electronic Systems and Devices», Bauman Moscow

State Technical University

E-mail: chernshv@bmstu.ru

S.L. Shmakov – Ph.D.(Chem.), Associate Professor, Department of Polymers, Saratov State University named after

N.G. Chernyshevsky

E-mail: ShmakovSL@info.sgu.ru

Abstract:

A varyzone structure model is considered, where recombination channels are switched due to the carriers being dragged by the internal electric field into the region with a lower recombination rate. Such an effect leads to an improvement in a number of technically useful semiconductor properties. Basing on our calculations performed, it was concluded how the dragging of carriers influences on the carrier concentration profile in thin and thick samples.

Pages: 87-92
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Date of receipt: 17 августа 2018 г.