B. I. Yakubovich

Nonlinear electric low-frequency fluctuations in semiconductors were investigated. Noise 1/f which usually is dominating in the field of low frequencies was considered. Noise of this type is connected with defects of structure of semiconductors. Nonlinear properties of the low-frequency noise caused by passage of a current were studied. Electric current leads to heating of the sample. Rise in temperature causes increase in concentration of point defects in the semiconductor. It is shown that the rise in temperature caused by a current, leads to nonlinearity of low-frequency electric noise in semiconductors. Nonlinear low-frequency electric noise in semiconductors is theoretically investigated, and its quantitative description is given. Change of concentration of point defects in the semiconductor, caused by a current is analysed. The kind of dependence of concentration of defects from the rise in temperature caused by a current is found out. Connection of change of temperature of the semiconductor with current value is determined. Quantitative connection of concentration of the defects, which have been the reason of low-frequency noise, with electric current value is established. The kind of dependence of spectral density of low-frequency noise from rise in temperature of the semiconductor caused by a current is determined. Dependence of spectral density of fluctuations of a current from its value is established, is shown that it has nonlinear character. It is calculated the expression for a spectrum of low-frequency electric noise in semiconductors taking into account the nonlinear phenomena. Connection of spectral density of nonlinear noise with semiconductor characteristics is established. It is discovered that nonlinear fluctuations contain the information about the physical processes leading to failure of semiconductor electronic devices. It is substantiated application of nonlinear fluctuations for nondestructive control of electronic devices. It is shown that use of properties of nonlinear fluctuations can rise effectiveness of methods of nondestructive control based on the analysis of electric noise.