B. Balbashio1, A.A. Skrylev2, D.V. Shestakov3, L.M. Vinogradova4, I.S. Belokon5, A.V. Nezhdanov6, A.I. Mashin7

1–7 Lobachevsky National Research Nizhny Novgorod State University (Nizjni Novgorod, Russia)
1 bbalbasi@gmail.com, 2 skrylev.lexa@mail.ru, 3 danil.shestakov@unn.ru, 4 lidiya.vinogradova@unn.ru, 5 belocon.11.do@gmail.com, 6 nezhdanov@phys.unn.ru, 7 mashin@unn.ru

Using X-ray diffraction data, the crystal structure of the zinc-tin nitride film was analyzed. Since determining the crystalline properties of such complex structures is a difficult task, an analytical method (mathematical calculations and assumptions) was used. The reliability of the results was verified using the ITO13 computer program. It was found that the obtained results are consistent with the literature data and are within the permissible limits. As a result of the analyses, it was determined that the ZnSnN2 film under study has an orthorhombic crystal system with the unit cell parameters a = 5.8059 Å, b = 6.4679 Å, c = 5.5816 Å and an angle
β = 90°.

Balbashio B., Skrylev A.A., Shestakov D.V., Vinogradova L.M., Belokon I.S., Nezhdanov A.V., Mashin A.I. Analysis of the crystal structure of ZnSnN2 by X-ray diffraction. Nanotechnology: development and applications – XXI century. 2025. V. 17. № 3. P. 26–33. DOI: https://doi.org/10.18127/ j22250980-202503-03 (in Russian)

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