A.Kh. Abduev1, A.Sh. Asvarov2, A.K. Akhmedov3, S.V. Agasieva4, V.V. Belyaev5, A.S. Borisova6, L.S. Flyzhnikova7, F.M.A. Abdelrkhman8

1, 4–8 Peoples' Friendship University of Russia (Moscow, Russia),
2, 3 Institute of Physics, Dagestan Federal Research Center of the Russian Academy of Sciences (Makhachkala, Republic Dagestan)
5 Moscow State Regional University (Mytishchi, Moscow Region, Russia)
 

A number of standard tests exist to test the service life of a transparent electronics device. For long-term operation suitability, an important external factor is occupied by a damp heat test, which determines the suitability of devices or their components for transportation, storage and operation in high humidity conditions. During damp heat testing of transparent electrodes based on wide-band oxides, the presence of oxygen and water vapor in the test chamber can significantly affect the results of such tests, since one of the key factors affecting the degradation of the electrical characteristics of oxide layers is the migration of oxygen or water vapor along the grain boundaries of the layers.

Purpose – the analysis is devoted to elucidation of the conditions and mechanisms of degradation of transparent conducting ZnO-based layers under the long-term damp heat treatment. The search for ways to increase the stability of layers in damp heat environment requires studying the relationship between the temperatures of layer synthesis, their porosity, and degradation of layers due to diffusion of environmental components along grain boundaries.

To analyze the degradation characteristics of functional performances of taransparent conducting oxide layers, damp heat test results for ZnO-based layers deposited by magnetron sputtering at different substrate temperatures and different types of doping are used. It is shown that the high porosity of ZnO-based layers synthesized at relatively low temperatures is an important factor leading to degradation of their functional characteristics.

Obtaining reliable data in this area will make it possible to accelerate the search for new materials and technologies for the further development of transparent electronics devices.

Abduev A.Kh., Asvarov A.Sh., Akhmedov A.K., Agasieva S.V., Belyaev V.V., Borisova A.S., Flyzhnikova L.S., Abdelrkhman F.M.A. Stability of characteristics of nanostructured transparent conductive layers based on zinc oxide. Nanotechnology: development and applications – XXI century. 2022. V. 14. № 1. P. 22–30. DOI: https://doi.org/10.18127/j22250980-202201-03 (in Russian)

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